[IEEE 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2012.10.2-2012.10.4)] 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Applying S-graphs for modeling metrological support and control systems
- 作者Palchun, Yu. A.; Yelistratova, I. B.; Yakimova, I. V.; Zemtsov, C. P.; Kvitkova, I. G.
- 文件大小430.54KB
- 发表时间2012
- DOI10.1109/apeie.2012.6629146
- 页码81-85
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