[IEEE 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2012.10.2-2012.10.4)] 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Application of S-graphs for modeling systems of metrological procurement and control
Palchun, Yu. A.; Elistratova, I. B.; Yakimova, I. V.; Zemtsov, S. P.; Kvitkova, I. G.
- 作者Palchun, Yu. A.; Elistratova, I. B.; Yakimova, I. V.; Zemtsov, S. P.; Kvitkova, I. G.
- 文件大小373.38KB
- 发表时间2012
- DOI10.1109/apeie.2012.6628959
- 页码73-77