Resolution of Diagnosis Based on Transition Faults

• 期刊名称IEEE Transactions on Very Large Scale Integration (VLSI) Systems
• 作者Pomeranz, Irith; Reddy, Sudhakar M.
• 卷第20卷
• 期第1期
• 印刷ISSN1063-8210
• 文件大小233.19KB
• 发表时间2012-01
• DOI10.1109/tvlsi.2010.2091975
• 页码172-176