发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2012.10.2-2012.10.4)] 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - System models of metrological support and manufacturing control

[IEEE 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2012.10.2-2012.10.4)] 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - System models of metrological support and manufacturing control

Palchun, Yu. A.; Yelistratova, I. B.

作者Palchun, Yu. A.; Yelistratova, I. B.
文件大小458.86KB
发表时间2012
DOI10.1109/apeie.2012.6629147
页码86-91

← 返回【学霸图书馆】主页