[IEEE 2012 15th International Workshop on Computational Electronics (IWCE) - Madison, WI, USA (2012.05.22-2012.05.25)] 2012 15th International Workshop on Computational Electronics - Reliability of GaN HEMTs: Current degradation in GaN/AlGaN/AlN/GaN HEMT
- 作者Padmanabhan, Balaji; Vasileska, Dragica; Goodnick, Stephen M.
- 文件大小3322.23KB
- 发表时间2012
- DOI10.1109/iwce.2012.6242851
- 页码1-4
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