[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Backend dielectric chip reliability simulator for complex interconnect geometries
- 作者Chen, Chang-Chih; Bashir, Muhammad; Milor, Linda; Kim, Dae Hyun; Lim, Sung Kyu
- 文件大小421.58KB
- 发表时间2012
- DOI10.1109/irps.2012.6241878
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