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[IEEE 2012 XXVth International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV 2012) - Tomsk, Russia (2012.09.2-2012.09.7)] 2012 25th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV) - Dependence of asperity depth on secondary electron emission coefficient

[IEEE 2012 XXVth International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV 2012) - Tomsk, Russia (2012.09.2-2012.09.7)] 2012 25th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV) - Dependence of asperity depth on secondary electron emission coefficient

Fujita, Sho; Iwao, Toru; Yumoto, Motoshige

作者Fujita, Sho; Iwao, Toru; Yumoto, Motoshige
文件大小2730.81KB
发表时间2012
DOI10.1109/deiv.2012.6412444
页码36-40

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