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[IEEE 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Tallinn, Estonia (2012.04.18-2012.04.20)] 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Genetic method for compressed skewed-load delay test generation

[IEEE 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Tallinn, Estonia (2012.04.18-2012.04.20)] 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Genetic method for compressed skewed-load delay test generation

Dobai, Roland; Balaz, Marcel

作者Dobai, Roland; Balaz, Marcel
文件大小156.89KB
发表时间2012
DOI10.1109/ddecs.2012.6219065
页码242-247

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