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[IEEE 2012 16th International Symposium on Electromagnetic Launch Technology (EML) - Beijing, China (2012.05.15-2012.05.19)] 2012 16th International Symposium on Electromagnetic Launch Technology - Study on damage effect and threshold of high energy 1.06µm-wavelength long-pulse laser to photo detector

[IEEE 2012 16th International Symposium on Electromagnetic Launch Technology (EML) - Beijing, China (2012.05.15-2012.05.19)] 2012 16th International Symposium on Electromagnetic Launch Technology - Study on damage effect and threshold of high energy 1.06µm-wavelength long-pulse laser to photo detector

Tang, Lei; Wang, Jianhua; Li, Jun; Hao, Qun

作者Tang, Lei; Wang, Jianhua; Li, Jun; Hao, Qun
文件大小282.01KB
发表时间2012
DOI10.1109/eml.2012.6325053
页码1-5

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