Defects in an Electron-Irradiated 6H-SiC Diode Studied by Alpha Particle Induced Charge Transient Spectroscopy: Their Impact on the Degraded Charge Collection Efficiency
- 期刊名称Materials Science Forum
- 作者Iwamoto, Naoya; Koizumi, Atsushi; Onoda, Shinobu; Makino, Takahiro; Ohshima, Takeshi; Kojima, Kazutoshi; Koike, S.; Uchida, Kazuo; Nozaki, Shinji
- 电子ISSN1662-9752
- 文件大小356.82KB
- 发表时间2012-5
- DOI10.4028/www.scientific.net/MSF.717-720.267
- 页码267-270
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