Original Methods for Diffusion Measurements in Polycrystalline Thin Films
Portavoce, Alain; Blum, Ivan; Hoummada, Khalid; Mangelinck, Dominique; Chow, Lee; Bernardini, Jean
- 期刊名称Defect and Diffusion Forum
- 作者Portavoce, Alain; Blum, Ivan; Hoummada, Khalid; Mangelinck, Dominique; Chow, Lee; Bernardini, Jean
- 卷第322卷
- 电子ISSN1662-9507
- 文件大小2056.45KB
- 发表时间2012-3
- DOI10.4028/www.scientific.net/DDF.322.129
- 页码129-150