An AES chip with DPA resistance using hardware-based random order execution
Yu, Bo; Li, Xiangyu; Chen, Cong; Sun, Yihe; Wu, Liji; Zhang, Xiangmin
- 期刊名称Journal of Semiconductors
- 作者Yu, Bo; Li, Xiangyu; Chen, Cong; Sun, Yihe; Wu, Liji; Zhang, Xiangmin
- 卷第33卷
- 期第6期
- 印刷ISSN1674-4926
- 文件大小315.50KB
- 发表时间2012-06
- DOI10.1088/1674-4926/33/6/065009