AIP Conference Proceedings [AIP INDIAN VACUUM SOCIETY SYMPOSIUM ON THIN FILMS: SCIENCE AND TECHNOLOGY - Mumbai, India (9–12 November 2011)] - Influence of substrate bias voltage on the properties of sputtered nickel oxide thin films
Reddy, A. Mallikarjuna; Reddy, Ch. Seshendra; Reddy, Y. Ashok Kumar; Lydia, R.; Reddy, P. Sreedhara; Reddy, A. Sivasankar
- 作者Reddy, A. Mallikarjuna; Reddy, Ch. Seshendra; Reddy, Y. Ashok Kumar; Lydia, R.; Reddy, P. Sreedhara; Reddy, A. Sivasankar
- 印刷ISSN0094-243X
- 文件大小361.66KB
- 发表时间2012
- DOI10.1063/1.4732405
- 页码174-175