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Profile estimation for Pt submicron wire on rough Si substrate from experimental data

Profile estimation for Pt submicron wire on rough Si substrate from experimental data

Karamehmedović, Mirza; Hansen, Poul-Erik; Dirscherl, Kai; Karamehmedovi, Emir; Wriedt, Thomas
  • 期刊名称Optics Express
  • 作者Karamehmedović, Mirza; Hansen, Poul-Erik; Dirscherl, Kai; Karamehmedovi, Emir; Wriedt, Thomas
  • 卷第20卷
  • 期第19期
  • 电子ISSN1094-4087
  • 文件大小1624.15KB
  • 发表时间2012-09-10
  • DOI10.1364/OE.20.021678
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