SPIE Proceedings [SPIE 16th International Workshop on Physics of Semiconductor Devices - Kanpur, India (Monday 19 December 2011)] 16th International Workshop on Physics of Semiconductor Devices - Characterization of dislocation-based nanotransistors

• 作者Reiche, Manfred; Kittler, Martin; Katiyar, Monica; Mazhari, B.; Mohapatra, Y N.
• 卷第8549卷
• 印刷ISSN0277-786X
• 文件大小531.25KB
• 发表时间2012
• DOI10.1117/12.927401