Terahertz Detection With Nanoscale Semiconductor Rectifiers

Chen, Rui; Song, Jungwoo; Lin, Teng-Yin; Aizin, Gregory R.; Kawano, Yukio; Aoki, Nobuyuki; Ochiai, Yuichi; Whiteside, Vincent R.; McCombe, Bruce D.; Thomas, David; Einhorn, Mike; Reno, John L.; Strasser, Gottfried; Bird, Jonathan P.

期刊名称IEEE Sensors Journal
作者Chen, Rui; Song, Jungwoo; Lin, Teng-Yin; Aizin, Gregory R.; Kawano, Yukio; Aoki, Nobuyuki; Ochiai, Yuichi; Whiteside, Vincent R.; McCombe, Bruce D.; Thomas, David; Einhorn, Mike; Reno, John L.; Strasser, Gottfried; Bird, Jonathan P.
卷第13卷
期第1期
印刷ISSN1530-437X
电子ISSN1558-1748
文件大小604.79KB
发表时间2013-01
DOI10.1109/jsen.2012.2216522
页码24-30

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Terahertz Detection With Nanoscale Semiconductor Rectifiers