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Structural properties and electroforming-free resistive switching characteristics of GdOx, TbOx, and HoOx memory devices

Structural properties and electroforming-free resistive switching characteristics of GdOx, TbOx, and HoOx memory devices

Pan, Tung-Ming; Lu, Chih-Hung

期刊名称Materials Chemistry and Physics
作者Pan, Tung-Ming; Lu, Chih-Hung
卷第139卷
印刷ISSN0254-0584
文件大小650.91KB
发表时间2013-5
DOI10.1016/j.matchemphys.2013.01.015
页码437-442

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