$Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography$

Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography

Béché, A.; Rouvière, J.L.; Barnes, J.P.; Cooper, D.

期刊名称Ultramicroscopy
作者Béché, A.; Rouvière, J.L.; Barnes, J.P.; Cooper, D.
卷第131卷
印刷ISSN0304-3991
文件大小4786.12KB
发表时间2013-8
DOI10.1016/j.ultramic.2013.03.014
页码10-23

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Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography