Morphology, Thermal Stability, and Electrical Conductivity of Polymer Nanocomposites of Isotactic Polypropylene/Multi-Walled Carbon Nanotubes
- 期刊名称International Journal of Polymeric Materials
- 作者Ávila-Orta, C. A.; Raudry-López, C. E.; Dávila-Rodríguez, M. V.; Aguirre-Figueroa, Y. A.; Cruz-Delgado, V. J.; Neira-Velázquez, M. G.; Medellín-Rodríguez, F. J.; Hsiao, B. S.
- 卷第62卷
- 期第12期
- 印刷ISSN0091-4037
- 电子ISSN1563-535X
- 文件大小1478.70KB
- 发表时间2013-06-18
- DOI10.1080/00914037.2013.769159
- 页码635-641
[IEEE 2012 IEEE 14th International Conference on Communication Technology (ICCT) - Chengdu, China (2012.11.9-2012.11.11)] 2012 IEEE 14th International Conference on Communication Technology - Joint coding and modulation diversity MIMO DFT-S-OFDM schemeXiang Gao, ; Zhanji Wu, · 2012
[IEEE 2012 11th International Conference on Signal Processing (ICSP 2012) - Beijing, China (2012.10.21-2012.10.25)] 2012 IEEE 11th International Conference on Signal Processing - Active control of SαS impulsive noise based on a sigmoid transformation algorithmZhou, Yali; Yin, Yixin; Zhang, Qizhi · 2012
[IEEE 2012 IEEE 14th International Conference on Communication Technology (ICCT) - Chengdu, China (2012.11.9-2012.11.11)] 2012 IEEE 14th International Conference on Communication Technology - Phase-locked frequency source in the S-band transceiver systemMa Mingxiao, ; Wang Hao, ; Li Zhijun, · 2012
[IEEE 2012 18th IEEE International Conference on Networks (ICON) - Singapore, Singapore (2012.12.12-2012.12.14)] 2012 18th IEEE International Conference on Networks (ICON) - The effect of payload length on QoS in IEEE 802.11s Wireless Mesh NetworksElahi, Ehsan; Qayyum, Amir; Naz, Sheneela · 2012
[IEEE 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Xian, China (2012.10.29-2012.11.1)] 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology - A compact implementation of masked AES S-boxWei, Wei; Cui, Xiaoxin; Wu, Di; Li, Rui; Ma, Kaisheng; Yu, Dunshan; Cui, Xiaole · 2012
[IEEE 2012 11th IEEE International Conference on Cognitive Informatics & Cognitive Computing (ICCI*CC) - Kyoto, Japan (2012.08.22-2012.08.24)] 2012 IEEE 11th International Conference on Cognitive Informatics and Cognitive Computing - Construction and analysis of dynamic S-boxes based on spatiotemporal chaosPeng, Jun; Jin, Shangzhu; Lei, Liang; Liao, Xiaofeng · 2012
[IEEE 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Xian, China (2012.10.29-2012.11.1)] 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology - A SHA-less 10-bit 80-MS/s CMOS pipelined ADCJung, Young-Mok; Zhe, Jin; Kwon, Chan-Keun; Kim, Hoon-Ki; Kim, Soo-Won · 2012
[IEEE 2012 18th IEEE International Conference on Networks (ICON) - Singapore, Singapore (2012.12.12-2012.12.14)] 2012 18th IEEE International Conference on Networks (ICON) - Achieving fairness for multi-class traffic in directional multi-interface IEEE 802.11s MCCAChakraborty, Sandip; Nandi, Sukumar · 2012
Variability Improvement by Interface Passivation and EOT Scaling of InGaAs Nanowire MOSFETsGu, Jiangjiang J.; Wang, Xinwei; Wu, Heng; Gordon, Roy G.; Ye, Peide D. · IEEE Electron Device Letters · 2013
Low-Frequency Noise and Random Telegraph Noise on Near-Ballistic III-V MOSFETsSi, Mengwei; Conrad, Nathan J.; Shin, Sanghoon; Gu, Jiangjiang; Zhang, Jingyun; Alam, Muhammad Ashraful; Ye, Peide D. · IEEE Transactions on Electron Devices · 2015
Effects of forming gas anneal on ultrathin InGaAs nanowire metal-oxide-semiconductor field-effect transistorsSi, Mengwei; Gu, Jiangjiang J.; Wang, Xinwei; Shao, Jiayi; Li, Xuefei; Manfra, Michael J.; Gordon, Roy G.; Ye, Peide D. · Applied Physics Letters · 2013
New insights in the passivation of high-k/InP through interface characterization and metal–oxide–semiconductor field effect transistor demonstration: Impact of crystal orientationXu, Min; Gu, Jiangjiang J.; Wang, Chen; Zhernokletov, D. M.; Wallace, R. M.; Ye, Peide D. · Journal of Applied Physics · 2013
[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - Characterization and reliability of III-V gate-all-around MOSFETsSi, Mengwei; Shin, SangHoon; Conrad, Nathan J.; Gu, Jiangjiang; Zhang, Jingyun; Alam, Muhammad A.; Ye, Peide D. · 2015