[IEEE 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Austin, TX, USA (2012.10.3-2012.10.5)] 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Dual-edge-triggered FF with timing error detection capabilityNamba, Kazuteru; Katagiri, Takashi; Ito, Hideo · 2012