The enhancement of unipolar resistive switching behavior via an amorphous TiOx layer formation in Dy2O3-based forming-free RRAM
Zhao, Hongbin; Tu, Hailing; Wei, Feng; Zhang, Xinqiang; Xiong, Yuhua; Du, Jun
- 期刊名称Solid-State Electronics
- 作者Zhao, Hongbin; Tu, Hailing; Wei, Feng; Zhang, Xinqiang; Xiong, Yuhua; Du, Jun
- 卷第89卷
- 印刷ISSN0038-1101
- 文件大小1480.58KB
- 发表时间2013-11
- DOI10.1016/j.sse.2013.06.011
- 页码12-16