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An electrically actuated imperfect microbeam: Dynamical integrity for interpreting and predicting the device response

An electrically actuated imperfect microbeam: Dynamical integrity for interpreting and predicting the device response

Laura Ruzziconi, Mohammad I. Younis, Stefano Lenci
  • 作者Laura Ruzziconi, Mohammad I. Younis, Stefano Lenci
  • 卷第48卷
  • 期第7期
  • 文件大小820.19KB
  • 发表时间2013-09
  • DOI10.1007/s11012-013-9707-x
  • 页码1761-1775
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