发现好书期刊,享受阅读乐趣

海量图书期刊资源,随时随地畅享阅读乐趣

Calculation of Cross Section for Ion-Induced SEU Through Direct Ionization in Nanometric Silicon Devices With Small Critical Energy

Calculation of Cross Section for Ion-Induced SEU Through Direct Ionization in Nanometric Silicon Devices With Small Critical Energy

Murat, Michael; Barak, Joseph; Akkerman, Avraham
  • 期刊名称IEEE Transactions on Nuclear Science
  • 作者Murat, Michael; Barak, Joseph; Akkerman, Avraham
  • 卷第60卷
  • 期第4期
  • 印刷ISSN0018-9499
  • 电子ISSN1558-1578
  • 文件大小1954.43KB
  • 发表时间2013-08
  • DOI10.1109/TNS.2013.2273291
  • 页码3092-3103
← 返回【学霸图书馆】主页