SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Development of program package for investigation and modeling of carbon nanostructures in diamond like carbon films with the help of Raman scattering and infrared absorption spectra line resolving

Hayrapetyan, David B.; Lehmann, Peter H.; Osten, Wolfgang; Hovhannisyan, Levon; Mantashyan, Paytsar A.; Albertazzi, Armando

作者Hayrapetyan, David B.; Lehmann, Peter H.; Osten, Wolfgang; Hovhannisyan, Levon; Mantashyan, Paytsar A.; Albertazzi, Armando
卷第8788卷
印刷ISSN0277-786X
文件大小248.11KB
发表时间2013
DOI10.1117/12.2020385

发现好书期刊，享受阅读乐趣