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The rise of computational techniques in atom probe microscopy

The rise of computational techniques in atom probe microscopy

Ceguerra, Anna V.; Breen, Andrew J.; Stephenson, Leigh T.; Felfer, Peter J.; Araullo-Peters, Vicente J.; Liddicoat, Peter V.; Cui, XiangYuan; Yao, Lan; Haley, Daniel; Moody, Michael P.; Gault, Baptiste; Cairney, Julie M.; Ringer, Simon P.
  • 期刊名称Current Opinion in Solid State and Materials Science
  • 作者Ceguerra, Anna V.; Breen, Andrew J.; Stephenson, Leigh T.; Felfer, Peter J.; Araullo-Peters, Vicente J.; Liddicoat, Peter V.; Cui, XiangYuan; Yao, Lan; Haley, Daniel; Moody, Michael P.; Gault, Baptiste; Cairney, Julie M.; Ringer, Simon P.
  • 卷第17卷
  • 期第5期
  • 印刷ISSN1359-0286
  • 文件大小4669.53KB
  • 发表时间2013-10
  • DOI10.1016/j.cossms.2013.09.006
  • 页码224-235
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