Test Technology Newsletter
Takeda, Kazuhisa; Tanaka, Kuniya; Kumamoto, Takafumi; Nojiri, Kazunori; Mori, Ryutaro; Taniguchi, Koichi; Matsuyama, Ryusei; Kato, Hideaki; Endo, Itaru
- 期刊名称Journal of Electronic Testing
- 作者Takeda, Kazuhisa; Tanaka, Kuniya; Kumamoto, Takafumi; Nojiri, Kazunori; Mori, Ryutaro; Taniguchi, Koichi; Matsuyama, Ryusei; Kato, Hideaki; Endo, Itaru
- 卷第29卷
- 期第5期
- 印刷ISSN0923-8174
- 电子ISSN1573-0727
- 文件大小207.96KB
- 发表时间2013-10
- DOI10.1007/s10836-013-5412-x
- 页码619-620