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Investigation of the instability of low-temperature poly-silicon thin film transistors under a negative bias temperature stress

Investigation of the instability of low-temperature poly-silicon thin film transistors under a negative bias temperature stress

Kim, Yu-Mi; Jeong, Kwang-Seok; Yun, Ho-Jin; Yang, Seung-Dong; Lee, Sang-Youl; Lee, Hi-Deok; Lee, Ga-Won
  • 期刊名称Electronic Materials Letters
  • 作者Kim, Yu-Mi; Jeong, Kwang-Seok; Yun, Ho-Jin; Yang, Seung-Dong; Lee, Sang-Youl; Lee, Hi-Deok; Lee, Ga-Won
  • 卷第9卷
  • 印刷ISSN1738-8090
  • 电子ISSN2093-6788
  • 文件大小780.12KB
  • 发表时间2013-10
  • DOI10.1007/s13391-013-3173-4
  • 页码13-16
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