![Study on the defects in metal–organic chemical vapor deposited zinc tin oxide thin films using negative bias illumination stability analysis]()
Study on the defects in metal–organic chemical vapor deposited zinc tin oxide thin films using negative bias illumination stability analysisKim, Un Ki; Rha, Sang Ho; Kim, Jeong Hwan; Chung, Yoon Jang; Jung, Jisim; Hwang, Eun Suk; Lee, Joohwi; Park, Tae Joo; Choi, Jung-Hae; Hwang, Cheol Seong · Journal of Materials Chemistry C · 2013