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Transition Fault Simulation Considering Broadside Tests as Partially-Functional Broadside Tests

Transition Fault Simulation Considering Broadside Tests as Partially-Functional Broadside Tests

Pomeranz, Irith
  • 期刊名称IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • 作者Pomeranz, Irith
  • 卷第21卷
  • 期第7期
  • 印刷ISSN1063-8210
  • 电子ISSN1557-9999
  • 文件大小162.96KB
  • 发表时间2013-07
  • DOI10.1109/tvlsi.2012.2206835
  • 页码1359-1363
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