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[IEEE 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - New York City, NY, USA (2013.10.2-2013.10.4)] 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - BIST for logic and local interconnect resources in a novel mesh of cluster FPGA

[IEEE 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - New York City, NY, USA (2013.10.2-2013.10.4)] 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - BIST for logic and local interconnect resources in a novel mesh of cluster FPGA

Rehman, Saif-Ur; Benabdenbi, Mounir; Anghel, Lorena
  • 作者Rehman, Saif-Ur; Benabdenbi, Mounir; Anghel, Lorena
  • 文件大小784.40KB
  • 发表时间2013
  • DOI10.1109/dft.2013.6653622
  • 页码296-301
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