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[IEEE 2013 IEEE Conference on Reliability Science for Advanced Materials and Devices (RSAMD) - Golden, CO, USA (2013.2.24-2013.2.25)] 2013 IEEE Conference on Reliability Science for Advanced Materials and Devices - Reliability challenges of FinFET and other multi-gate MOSFETs

[IEEE 2013 IEEE Conference on Reliability Science for Advanced Materials and Devices (RSAMD) - Golden, CO, USA (2013.2.24-2013.2.25)] 2013 IEEE Conference on Reliability Science for Advanced Materials and Devices - Reliability challenges of FinFET and other multi-gate MOSFETs

Mohseni, Javaneh; Meindl, James D.
  • 作者Mohseni, Javaneh; Meindl, James D.
  • 文件大小320.31KB
  • 发表时间2013
  • DOI10.1109/rsamd.2013.6647897
  • 页码1-4
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