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[IEEE 2013 IEEE/ACIS 12th International Conference on Computer and Information Science (ICIS) - Niigata, Japan (2013.06.16-2013.06.20)] 2013 IEEE/ACIS 12th International Conference on Computer and Information Science (ICIS) - Scenario specification based testing model generation

[IEEE 2013 IEEE/ACIS 12th International Conference on Computer and Information Science (ICIS) - Niigata, Japan (2013.06.16-2013.06.20)] 2013 IEEE/ACIS 12th International Conference on Computer and Information Science (ICIS) - Scenario specification based testing model generation

Liang, Beilei; Liu, Pan; Miao, Huaikou

作者Liang, Beilei; Liu, Pan; Miao, Huaikou
文件大小782.51KB
发表时间2013
DOI10.1109/icis.2013.6607863
页码335-340

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