[IEEE 2013 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2013.10.13-2013.10.17)] 2013 IEEE International Integrated Reliability Workshop Final Report - On the nature of “permanent” degradation in NBTI

• 作者Nguyen, D. D.; Kouhestani, C.; Kambour, K. E.; Devine, R. A. B.
• 文件大小299.76KB
• 发表时间2013
• DOI10.1109/iirw.2013.6804181
• 页码150-153