[IEEE 2013 IEEE Electrical Insulation Conference (EIC) - Ottawa, ON, Canada (2013.06.2-2013.06.5)] 2013 IEEE Electrical Insulation Conference (EIC) - Reliability estimation for populations with limited and heavily censored failure information
Chmura, Lukasz; Morshuis, P. H. F.; Gulski, E.; Smit, J. J.; Janssen, Anton
- 作者Chmura, Lukasz; Morshuis, P. H. F.; Gulski, E.; Smit, J. J.; Janssen, Anton
- 文件大小466.71KB
- 发表时间2013
- DOI10.1109/eic.2013.6554224
- 页码159-163