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[IEEE 2013 18th IEEE European Test Symposium (ETS) - Avignon, France (2013.05.27-2013.05.30)] 2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - A layout-aware x-filling approach for dynamic power supply noise reduction in at-speed scan testing

[IEEE 2013 18th IEEE European Test Symposium (ETS) - Avignon, France (2013.05.27-2013.05.30)] 2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - A layout-aware x-filling approach for dynamic power supply noise reduction in at-speed scan testing

Kiamehr, Saman; Firouzi, Farshad; Tahoori, Mehdi B.

作者Kiamehr, Saman; Firouzi, Farshad; Tahoori, Mehdi B.
文件大小373.82KB
发表时间2013
DOI10.1109/ets.2013.6569356
页码1-6

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