[IEEE 2013 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP 2013) - Chenzhen, China (2013.10.20-2013.10.23)] 2013 Annual Report Conference on Electrical Insulation and Dielectric Phenomena - The effect of material interfaces on electrical tree growth and breakdown time of epoxy resin

• 作者Pattouras, M.; Tzimas, A.; Rowland, S. M.
• 文件大小508.58KB
• 发表时间2013
• DOI10.1109/ceidp.2013.6747070
• 页码796-799