[IEEE 2013 IEEE 31st VLSI Test Symposium (VTS) - Berkeley, CA (2013.4.29-2013.5.2)] 2013 IEEE 31st VLSI Test Symposium (VTS) - Improving test generation by use of majority gates
- 作者Wohl, P.; Waicukauski, J. A.
- 文件大小602.01KB
- 发表时间2013
- DOI10.1109/vts.2013.6548883
- 页码1-6
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