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Deterministic Identity Testing of Depth-4 Multilinear Circuits with Bounded Top Fan-in

Deterministic Identity Testing of Depth-4 Multilinear Circuits with Bounded Top Fan-in

Karnin, Zohar S.; Mukhopadhyay, Partha; Shpilka, Amir; Volkovich, Ilya
  • 期刊名称SIAM Journal on Computing
  • 作者Karnin, Zohar S.; Mukhopadhyay, Partha; Shpilka, Amir; Volkovich, Ilya
  • 卷第42卷
  • 期第6期
  • 印刷ISSN0097-5397
  • 电子ISSN1095-7111
  • 文件大小288.46KB
  • 发表时间2013-01
  • DOI10.1137/110824516
  • 页码2114-2131
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