Compact Modeling of Statistical BTI Under Trapping/Detrapping

Bhaskarr Velamala, Jyothi; Sutaria, Ketul B.; Shimizu, Hirofumi; Awano, Hiromitsu; Sato, Takashi; Wirth, Gilson; Yu Cao,

期刊名称IEEE Transactions on Electron Devices
作者Bhaskarr Velamala, Jyothi; Sutaria, Ketul B.; Shimizu, Hirofumi; Awano, Hiromitsu; Sato, Takashi; Wirth, Gilson; Yu Cao,
卷第60卷
期第11期
印刷ISSN0018-9383
电子ISSN1557-9646
文件大小2255.49KB
发表时间2013-11
DOI10.1109/ted.2013.2281986
页码3645-3654

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