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[IEEE 2013 IEEE/MTT-S International Microwave Symposium - MTT 2013 - Seattle, WA, USA (2013.06.2-2013.06.7)] 2013 IEEE MTT-S International Microwave Symposium Digest (MTT) - Linearity analysis of millimeter wave GaN power transistors through X-parameters and TCAD device simulations

[IEEE 2013 IEEE/MTT-S International Microwave Symposium - MTT 2013 - Seattle, WA, USA (2013.06.2-2013.06.7)] 2013 IEEE MTT-S International Microwave Symposium Digest (MTT) - Linearity analysis of millimeter wave GaN power transistors through X-parameters and TCAD device simulations

Guerra, Diego; Saraniti, Marco; Ferry, David K.; Goodnick, Stephen M.

作者Guerra, Diego; Saraniti, Marco; Ferry, David K.; Goodnick, Stephen M.
文件大小227.75KB
发表时间2013
DOI10.1109/MWSYM.2013.6697725
页码1-4

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