![Development of Variable Temperature Scanning Microwave Microscope for High Throughput Materials Characterization]()
Development of Variable Temperature Scanning Microwave Microscope for High Throughput Materials CharacterizationOkazaki, Noriaki; Okazaki, Sohei; Takahashi, Ryota; Murakami, Makoto; Ahmet, Parhat; Kakiuchi, Nobuyuki; Furusho, Hitoshi; Nishino, Taito; Furubayashi, Yutaka; Fukumura, Tomoteru; Matsumoto, Yuji; Kawasaki, Masashi; Chikyow, Toyohiro; Koinuma, Hideomi; Hasegawa, Tetsuya · MRS Proceedings · 2005