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[IEEE 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Oxford, United Kingdom (2013.9.23-2013.9.27)] 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - SET tolerance of 65 nm CMOS majority voters: A comparative study

[IEEE 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Oxford, United Kingdom (2013.9.23-2013.9.27)] 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - SET tolerance of 65 nm CMOS majority voters: A comparative study

Danilov, Igor A.; Gorbunov, Maxim S.; Antonov, Andrey A.
  • 作者Danilov, Igor A.; Gorbunov, Maxim S.; Antonov, Andrey A.
  • 文件大小1355.11KB
  • 发表时间2013
  • DOI10.1109/radecs.2013.6937384
  • 页码1-6
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