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[IEEE 2013 11th East-West Design and Test Symposium (EWDTS) - Rostov-on-Don, Russia (2013.09.27-2013.09.30)] East-West Design & Test Symposium (EWDTS 2013) - Analyses of two run march tests with address decimation for BIST procedure

[IEEE 2013 11th East-West Design and Test Symposium (EWDTS) - Rostov-on-Don, Russia (2013.09.27-2013.09.30)] East-West Design & Test Symposium (EWDTS 2013) - Analyses of two run march tests with address decimation for BIST procedure

Mrozek, Ireneusz; Yarmolik, Svetlana V.

作者Mrozek, Ireneusz; Yarmolik, Svetlana V.
文件大小98.33KB
发表时间2013
DOI10.1109/ewdts.2013.6673190
页码1-4

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