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Self-Heating Effects and Analog Performance Optimization of Fin-Type Field-Effect Transistors

Self-Heating Effects and Analog Performance Optimization of Fin-Type Field-Effect Transistors

Takahashi, Tsunaki; Beppu, Nobuyasu; Chen, Kunro; Oda, Shunri; Uchida, Ken

期刊名称Japanese Journal of Applied Physics
作者Takahashi, Tsunaki; Beppu, Nobuyasu; Chen, Kunro; Oda, Shunri; Uchida, Ken
卷第52卷
印刷ISSN0021-4922
电子ISSN1347-4065
文件大小512.88KB
发表时间2013-04-01
DOI10.7567/JJAP.52.04CC03

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