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Conductivity Degradation of 4H-SiC p–i–n Diode with In-Grown Stacking Faults

Conductivity Degradation of 4H-SiC p–i–n Diode with In-Grown Stacking Faults

Tanaka, Atsushi; Nakayama, Koji; Asano, Katsunori; Miyazawa, Tetsuya; Tsuchida, Hidekazu
  • 期刊名称Japanese Journal of Applied Physics
  • 作者Tanaka, Atsushi; Nakayama, Koji; Asano, Katsunori; Miyazawa, Tetsuya; Tsuchida, Hidekazu
  • 卷第52卷
  • 印刷ISSN0021-4922
  • 电子ISSN1347-4065
  • 文件大小300.56KB
  • 发表时间2013-04-01
  • DOI10.7567/jjap.52.04cp10
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