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High-Performance Embedded Technologies Improve Performance of Measuring and Testing Systems

High-Performance Embedded Technologies Improve Performance of Measuring and Testing Systems

Li, Ju Guang; Zhang, Hua
  • 期刊名称Advanced Materials Research
  • 作者Li, Ju Guang; Zhang, Hua
  • 电子ISSN1662-8985
  • 文件大小237.02KB
  • 发表时间2013-7
  • DOI10.4028/www.scientific.net/amr.718-720.820
  • 页码820-824
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