Resonant coupling for contactless measurement of carrier lifetime
- 期刊名称Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- 作者Ahrenkiel, Richard K.
- 卷第31卷
- 期第4期
- 印刷ISSN2166-2746
- 文件大小1720.24KB
- 发表时间2013
- DOI10.1116/1.4813757
Energy exchange in field emission from semiconductorsM. S. Chung; Y. J. Jang; A. Mayer; P. H. Cutler; N. M. Miskovsky; B. L. Weis · 2008
Simulations of field emission from a semiconducting (10,0) carbon nanotubeA. Mayer; N. M. Miskovsky; P. H. Cutler · 2002
Simulations of transport and field-emission properties of carbon nanotubesA. Mayer; N. M. Miskovsky; P. H. Cutler · 2003
Modeling of field-assisted emission from the image states of a glass substrateA. Mayer; M. S. Chung; N. Kumar; B. L. Weiss; N. M. Miskovsky; P. H. Cutler · 2006
Three-dimensional simulations of field emission through an oscillating barrier from a (10,0) carbon nanotubeA. Mayer; N. M. Miskovsky; P. H. Cutler · 2003
Theoretical comparison between field-emission properties of carbon protrusions ranging from an isolated atom to multi-wall nanotubesA. Mayer; N. M. Miskovsky; P. H. Cutler · 2003
Analysis of the efficiency with which geometrically asymmetric metal–vacuum–metal junctions can be used for the rectification of infrared and optical radiationsA. Mayer; M. S. Chung; P. B. Lerner; B. L. Weiss; N. M. Miskovsky; P. H. Cutler · 2012