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Persistence Length as a Metric for Modeling and Simulation of Nanoscale Communication Networks

Persistence Length as a Metric for Modeling and Simulation of Nanoscale Communication Networks

Bush, Stephen F.; Goel, Sanjay
  • 期刊名称IEEE Journal on Selected Areas in Communications
  • 作者Bush, Stephen F.; Goel, Sanjay
  • 卷第31卷
  • 期第12期
  • 印刷ISSN0733-8716
  • 文件大小3722.88KB
  • 发表时间2013-12
  • DOI10.1109/JSAC.2013.SUP2.12130014
  • 页码815-824
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