SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Micro- and Nanotechnology Sensors, Systems, and Applications V - Effects of radiation-induced defects on the charge collection efficiency of a silicon carbide particle detector
- 作者Iwamoto, Naoya; George, Thomas; Islam, M. Saif; Onoda, Shinobu; Makino, Takahiro; Dutta, Achyut K.; Ohshima, Takeshi; Kojima, Kazutoshi; Nozaki, Shinji
- 卷第8725卷
- 印刷ISSN0277-786X
- 文件大小593.49KB
- 发表时间2013
- DOI10.1117/12.2016464
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