发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

Calibration of thickness-dependent
<i>k</i>
-factors for germanium X-ray lines to improve energy-dispersive X-ray spectroscopy of SiGe layers in analytical transmission electron microscopy

Calibration of thickness-dependent k -factors for germanium X-ray lines to improve energy-dispersive X-ray spectroscopy of SiGe layers in analytical transmission electron microscopy

Qiu, Y; Nguyen, V H; Dobbie, A; Myronov, M; Walther, T

期刊名称Journal of Physics: Conference Series
作者Qiu, Y; Nguyen, V H; Dobbie, A; Myronov, M; Walther, T
卷第471卷
印刷ISSN1742-6588
电子ISSN1742-6596
文件大小588.57KB
发表时间2013-11-29
DOI10.1088/1742-6596/471/1/012031

← 返回【学霸图书馆】主页